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Welcome
Aurora NanoDevices Inc. supplies high quality,
calibration systems for atomic force microscopy imaging. Founded in
2001, our systems are now found in hundreds of scanning probe
microscopes through North American, Europe, and Japan.
AFM scan
of a Tipcheck calibration surface showing the sharp, randomly-oriented
peaks which provide the optimal surface for characterising AFM tip
geometry. Image provided by Image Metrology Inc. |
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